SDS2104X Plus Super Phosphor Oscilloscope

Features:

• 100 MHz Bandwidth
• 4 + EXT Channels
• 2 GSa/s Sampling rate
• 500,000 wfm/s Capture rate
• 200 Mpts/ch Memory depth
• Serial bus triggering and decoder, supports I2C, SPI, UART/RS232, CAN, LIN
• USB Host, USB Device, LAN, External trigger, Auxiliary output (TRIG OUT, PASS/FAIL)
• 10.1 inch TFT-LCD with capacitive touch screen (1024x600)

The SDS2000X Plus Series employs SPO (Super Phosphor Oscilloscope) technology, 256-level intensity grading display function plus a color temperature display mode. It also employs an innovative digital trigger system with high sensitivity and low jitter. The trigger system supports multiple powerful triggering modes including serial bus triggering. History waveform recording, Sequence acquisition, Search and Navigate functions allow for extended waveform records to be captured, stored, and analyzed. An impressive array of measurement and math capabilities, options for a 50 MHz waveform generator, as well as serial decoding, mask test, bode plot, and power analysis are also features. A 10-bit acquisition mode helps to satisfy applications which require more than 8-bit resolution.

Excellent Operability

• Capacitive touch screen, supports multi-touch gestures, traces can be moved or scaled efficiently by a finger touch
• Built-in web server supports remote control over the LAN port using a web browser
• External mouse and keyboard support

Provides Higher Resolution and Lower Noise
10-bit mode combined with Zoom shows you more details and less noise on the waveform. The vertical and horizontal zoom feature of the SDS2000X Plus enable the user to pick a region and magnify the captured signal in order to conduct a more detailed analysis.

Power Loop Response Analysis (Bode Plot)
Siglent offers a solution for stability measurement - Signal source Power loop measurement with standard Free Bode Plot II software. Features higher measurement sensitivity and accuracy, variable excitation scan mode, user-friendly UI design, plus list and cursor measurements that are more intuitive.

Measurements for Parameters and Parameter Statistics
Parameter measurements includes 4 categories - horizontal, vertical, miscellaneous and channel delay providing a total of 50+ different types of measurements. Measurements can be performed within a specified gate period. Measurements on Math, Reference and History frames are supported.

Statistics shows the current value, maximum value, minimum value, standard deviation and mean value of up to 12 parameters simultaneously. Histogram is available to show the probability distribution of a parameter. Trend is available to show the parameter value vs. time. In addition, horizontal measurements can process up to 1000 signal edges within one single frame, thus greatly improving the test efficiency.